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| Photo By Heather Clark
| Sandia National Laboratories researcher Armin Walter Doerry named a SPIE fellow for his work on imaging microwave radar technology |
ALBUQUERQUE, N.M. — Sandia National Laboratories researcher Armin Doerry has been named a SPIE fellow for his technical achievements in imaging microwave radar technology development, design and analysis.
Doerry is one of 32 new fellows honored this year by SPIE, an international society for optics and photonics established in 1955 as the Society for Photo-Optical Instrumentation Engineers.
Doerry’s work — conducted with many teams over his 29 years at Sandia and with industry and academic partners — has produced radar systems that today are finding military targets, gathering intelligence, helping with maritime search and rescue and protecting borders.
“I’m very gratified for the recognition that the larger radar community has given me,” Doerry said.
Doerry’s Sandia career coincides with radar projects that cover much of the growth of synthetic aperture radar. SAR was first developed in the 1950s. Sandia has been at the leading edge of the technology since the 1980s, undertaking research and development projects that decreased weight and costs while increasing SAR’s effectiveness.
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